E2V CCD Test Reports
CCD nickname |
Where |
Rated by E2V as |
Tested |
Instrument Target |
Rated by ODT as |
Defects measured by ODT (E2V) |
Notes |
||
Traps (cols) (1) |
Bias hot cols (2) |
Dark hot cols. (3) |
|||||||
ENGINEERING-SETUP GRADE DEVICES |
|||||||||
Alan
|
La Silla, 3.6m
|
Eng device
|
Jan 2000
|
CES |
Science
|
71
|
0
|
0
|
Outstanding QE, but large amount of traps (left side), has been shipped to Chile for CES final upgrade
|
Bruce
|
ODT lab/Safe
|
Eng device
|
March 2000
|
Giraffe |
Science but avoid mosaics, Giraffe
|
0
(8) |
3
(4) |
3
|
Despite a 20 um overhang this is an outstanding device with high QE. Glowing on top 50 lines out.
|
Ringo
|
Copenhagen
|
Eng device
|
Feb 2000
|
DFosc |
Classic Eng device, not so good, not so bad | 1
(7) |
10
(23) |
11
|
Sent to Danish people (DFOSC) as FINAL CCD, in March 2000
|
Julio
|
ODT lab/test cryostat
|
Setup grade
|
-
|
None |
Not tested
|
-
|
-
|
-
|
Mounted in Berta Head, Sebastian is playing with for contamination tests.
|
Iggy
|
La Silla/ODT
|
Setup grade
|
-
|
Spare
|
Tested data to be gathered
|
-
|
-
|
-
|
Used for preliminary tests for CES upgrade, in Chile, should be shipped back in Garching at some point.
|
Eva
|
ODT lab/Safe
|
Eng device
|
Sep 2000
|
None |
Seems dead
|
-
(4) |
-
(34) |
-
|
Given on loan to Danish people (DFOSC) in September 1999, should be shipped back in Garching at some point. Danish people may have killed this device. Tested here looks dead....
|
Rachel
|
ODT lab/Safe
|
Eng device
|
Aug 2000
|
Omegacam
|
Could be used for imagery (Science)
|
1
(1) |
8
(18) |
4
|
Good imaging device, should be exchanged by a non frame transfer Omegacam CCD
|
Satriani
|
ODT lab/Safe
|
-
|
None
|
?
|
?
|
?
|
?
|
Likely an enginering device
|
|
Antonio
|
ODT lab/Safe
|
Eng device
|
Sep 2000
|
Omegacam
|
-
|
-
(17) |
-
(18) |
-
|
Used for weak contamination tests, should be exchanged by a non frame transfer Omegacam CCD
|
SCIENCE GRADE DEVICES |
|||||||||
Carreras
|
ODT testbench
|
Science
|
Oct 2007
|
Giraffe |
Science
|
(1)
|
(0)
|
(0)
|
|
Kate
|
ODT lab/Safe
|
Science
|
Feb 2000
|
Spare |
Science
|
0
(3) |
2
(4) |
3
|
This device has not been thoroughly tested due to charge injection from the wiping drain. VDD must be reduced.
|
Celine
|
ODT lab/Safe
|
Science
|
Jan 2000
|
Spare |
Science Spare
|
2
(3) |
0
(1) |
0
|
2 sets of trap, perfect dark frame
|
Jasmin
|
ODT lab/Safe
|
Science
|
Jan 2000
|
Harps |
Science, HARPS possible candidate
|
1
(7) |
0
(1) |
?
|
Very nice device, no defects
|
Linda
|
ODT lab/Safe
|
Science
|
Dec 1999
|
Harps |
Science, HARPS possible candidate
|
2
(1) |
0
(2) |
0
|
Nice, no dark related defects
|
Paul
|
ODT lab/Safe
|
Science
|
Jan 2000
|
None |
Science
|
1 large
(3) |
1
(5) |
1
|
Has an ugly trap a X=1500, 5 cols
|
Barbarella
|
ODT lab/Safe
|
Science
|
Dec 1999
|
None |
Cannot be used for spectroscopy
|
0
(1) |
?
(1) |
?
|
Has a remanent defect in the middle, long dark frame to remake.Exchanged with BRUCE.
|
Annie
|
ODT lab/Safe
|
Science
|
Feb 2000
|
None |
Science
|
0
(2) |
1
(2) |
2
|
Not so nice for a science grade...! Beware ! VDD (Drain) must be 11V and VDR = 24 V (otherwise massive Glowing will occur) |
Elvis
|
ODT lab/Safe
|
Science
|
Feb 2000
|
Omegacam tracker spare |
Could be used for imagery (Science)
|
2
(5) |
5
(5) |
6
|
Nice Eng grade device, It looks like that E2V has used a trick to reduce IR fringing, because IR fringing is different than usual.
|
DEVICES SENT BACK TO E2V |
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Satriani v1
|
Sent back to E2V
|
Eng device
|
March 2000
|
-
|
Science, very nice
|
1
|
1
|
1
|
E2V said that this device has 82 traps ... it turns out to be a very nice science grade usable for spectroscopy... mistake from them ? Yes ! Indeed, this is 8462-13-2 instead of 8462-14-2, shipped back to E2V.
|
Satriani v2
|
Sent back to E2V
|
Eng device
|
Aug 2000
|
-
|
Unusable
|
(82)
|
(103)
|
-
|
Device has a huge charge injection in serial register, always saturated, not usable at all, rejected !
Sent back to E2V around beginning of Sep 2000 |
CCD nickname |
Where |
Rated by E2V as |
Tested |
Intrument Target |
Rated by ODT as |
Defects measured by ODT (E2V) |
Notes |
||
Traps (cols) (1) |
Bias hot cols (2) |
Dark hot cols. (3) |
|||||||
(1) trap visible with a 650 nm flat field
(2) hots columns visible over a bias frame
(3) hots columns visible over an hour dark exposure (including one visible in a bias frame)